Cross-sectional analysis of W-cored Ni nanoparticle via focused ion beam milling with impregnation
نویسندگان
چکیده
Tungsten and nickel bimetallic nanoparticle is synthesized by radio frequency thermal plasma process which belongs to the vapor phase condensation technology. The morphology and chemical composition of the synthesized particle were investigated using the conventional nanoparticle transmission electron microscopy (TEM) sample. A few part of them looked like core/shell structured particle, but ambiguities were caused by either TEM sample preparation or TEM analysis. In order to clarify whether a core/shell structure is developed for the particle, various methodologies were tried to prepare a cross-sectional TEM sample. Focused ion beam (FIB) milling was conducted for cold-compacted particles, dispersed particles on silicon wafer, and impregnated particles with epoxy which is compatible with electron beam. A sound cross-sectional sample was just obtained from cyanoacrylate impregnation and FIB milling procedure. A tungsten-cored nickel shell structure was precisely confirmed with aid of cross-sectional sample preparation method.
منابع مشابه
Improving High Resolution TEM Images using Low Energy Ion Milling
Ion beam milling has become a widespread specimen preparation technique for non-biological materials over the last two decades, particularly for cross-sectional and plan-view transmission electron microscope (TEM) specimens. The basic principle of ion milling involves bombarding a specimen with energetic ions or neutral atoms acclerated and formed into a tightly focused ion beam. Material is sp...
متن کاملInvestigation of Aspect Ratio of Hole Drilling from Micro to Nanoscale via Focused Ion Beam Fine Milling
Holes with different sizes from microscale to nanoscale were directly fabricated by focused ion beam (FIB) milling in this paper. Maximum aspect ratio of the fabricated holes can be 5:1 for the hole with large size with pure FIB milling, 10:1 for gas assistant etching, and 1:1 for the hole with size below 100 nm. A phenomenon of volume swell at the boundary of the hole was observed. The reason ...
متن کاملFIB Sample Preparation of Polymer Thin Films on Hard Substrates Using the Shadow-FIB Method
Focused ion beam (FIB) instrumentation has proven to be extremely useful for preparing cross-sectional samples for transmission electron microscopy (TEM) investigations. The two most widely used methods involve milling a trench on either side of an electron-transparent window: the “H-bar” and the “lift-out” methods [1]. Although these two methods are very powerful in their versatility and abili...
متن کاملFocused ion beam milling of microchannels in lithium niobate.
We present experimental and simulation results for focused ion beam (FIB) milling of microchannels in lithium niobate in this paper. We investigate two different cuts of lithium niobate, Y- and Z-cuts, and observe that the experimental material removal rate in the FIB for both Y-cut and Z-cut samples was 0.3 μm(3)/nC, roughly two times greater than the material removal rate previously reported ...
متن کاملMicrostructural Examination of Ni-ion Irradiated Fe-Ni-Cr Alloys Followed to Micro-zone Deformation
Examination of deformation microstructures induced by micro-indentation technique by means of transmission electron microscopy following an MV range metallic ion irradiation was performed in order to study the influence of irradiation-produced microstructural defects on plastic deformation behavior of materials. In this work, specimens of an Fe-Cr-Ni austenitic model ternary alloy before and af...
متن کامل